Optoelectronic properties of coexisting InGaZnO4 structures
نویسندگان
چکیده
Indium gallium zinc oxides (IGZO) have been developed for thin-film transistor technologies. In this work, we analyze the fundamental properties of crystalline InGaZnO 4 , considering all possible Ga/Zn atomic distribution patterns. Using hybrid Hartree-Fock density functional approach, most stable configurations are identified. The simulations reveal that considered indirect band-gap semiconductors with highly dispersive conduction bands (CB) and very flat valence (VB). Thereby, electron effective masses light, contrary to heavy hole masses. This implies a good mobility suppressed mobility, consequently low off-state current minimizes power consumption in future -based transistors. Coexistence different is not an issue since they present similar optoelectronic properties.
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ژورنال
عنوان ژورنال: Materials Science in Semiconductor Processing
سال: 2021
ISSN: ['1873-4081', '1369-8001']
DOI: https://doi.org/10.1016/j.mssp.2020.105297